The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Sep. 19, 2017
Seiko Epson Corporation, Tokyo, JP;
Hikaru Kurasawa, Shiojiri, JP;
Seiko Epson Corporation, , JP;
Abstract
A calibration data acquisition unit (a) acquires Q optical spectra and S evaluation spectra, (b) extracts R subsets from a set of the Q optical spectra, (c) performs independent component analysis in which component amounts in each sample treated as independent components on each of R subsets so as to acquire R×N component calibration spectra, (d) obtains an inner product value between the R×N component calibration spectrum and an evaluation spectrum, (e) selects a component calibration spectrum for which a correlation degree between a component amount for the target component and the inner product value is the maximum as the target component calibration spectrum from among the R×N component calibration spectra, and (f) creates a calibration curve by using the target component calibration spectrum.