The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Jan. 31, 2019
Diehl Metering Gmbh, Ansbach, DE;
Peter Ploss, Bayreuth, DE;
Michael Mayle, Ansbach, DE;
Diehl Metering GmbH, Ansbach, DE;
Abstract
A method for determining measurement information includes conducting waves excited by first oscillation transducers to second oscillation transducers or back to the first transducers and recording to determine measurement data. The measurement information is determined using first and second data or first data determine an excitation parameter of a second wave. The first transducers excite the second wave with polarities reversed relative to a polarity for excitation of a first wave, or subgroups of the first transducers operate differently to excite the first and second waves, and/or first and second subgroups of the first or second transducers are used for recording. Only measurement signals of the first subgroup are used, or measurement signals of first and second subgroups are added to record the first data. Only measurement signals of the second subgroup are used, or measurement signals of subgroups are subtracted, or vice versa, to record second data.