The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Jul. 19, 2019
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Wolfgang Hoegele, Rosenheim, DE;
Christian Hoerr, Flintsbach am Inn, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method and an arrangement for optically capturing an object with a light pattern projection are provided. The method includes projecting a predetermined number of light patterns on the object, capturing at least one image of the object when each of a respective light pattern is projected to obtain position location dependent image intensity values for a respective projected light pattern, determining a linear combination of the predetermined number of light patterns, and generating a synthesized image intensity value for at least one image location in the image plane which corresponds to an area of the local region. The synthesized image intensity value at the image location is determined by a linear combination of the image intensity values which includes the linear combination of the projection intensity values for the local region, and the projection intensity values are replaced by the image intensity values at the image location.