The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Jul. 12, 2018
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Yuji Hatanaka, Shiojiri, JP;

Yusuke Nakazawa, Shiojiri, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/165 (2006.01); B41J 2/045 (2006.01); B41J 2/21 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04508 (2013.01); B41J 2/04581 (2013.01); B41J 2/16517 (2013.01); B41J 2/16579 (2013.01); B41J 2/2142 (2013.01);
Abstract

A printing apparatus and a printing method that make it easy to visually confirm whether a printing defect has occurred are provided. A printing method according to an application example includes printing of image in which an image is printed onto a medium by a printing apparatus, detecting of state in which a state change is detected during operations of the printing apparatus in the printing of image, and printing of information in which state change information is printed onto the medium, based on the state change detected in the detecting of state. The state change information is associated with a position in the image where the state change is detected.


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