The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Jan. 27, 2017
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Wojciech Matusik, Lexington, MA (US);

Desai Chen, Malden, MA (US);

Melina Skouras, Cambridge, MA (US);

Bo Zhu, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 50/00 (2015.01); B33Y 10/00 (2015.01); G06F 30/00 (2020.01); G06F 30/23 (2020.01); B29C 64/386 (2017.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
B33Y 50/00 (2014.12); B29C 64/386 (2017.08); B33Y 10/00 (2014.12); G06F 30/00 (2020.01); G06F 30/23 (2020.01); G06F 2119/18 (2020.01);
Abstract

System and method for optimizing a three-dimensional model representing a shape of an object to be fabricated from a plurality of materials having known physical properties. The object is designed to exhibit one or more target properties and the three-dimensional model includes a plurality of cells. The system includes at least one processor programmed to receive a data structure including information for a material property gamut of microstructures for the plurality of materials and two or more of the known physical properties of the plurality of materials, and perform a topology optimization process on the three-dimensional model to generate an optimized model, wherein the topology optimization process is constrained based, at least in part, on the information in the received data structure and the one or more target properties.


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