The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2020
Filed:
Nov. 11, 2014
Applicant:
Cornell University, Ithaca, NY (US);
Inventors:
Milos Ivkovic, New York, NY (US);
Norman Relkin, Harrington Park, NJ (US);
Henning U. Voss, New York, NY (US);
Jonathan P. Dyke, New York, NY (US);
Assignee:
CORNELL UNIVERSITY, Ithaca, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G06T 7/00 (2017.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 5/4064 (2013.01); A61B 5/0042 (2013.01); A61B 5/055 (2013.01); A61B 5/4082 (2013.01); A61B 5/4088 (2013.01); A61B 5/7225 (2013.01); A61B 5/7246 (2013.01); A61B 5/7282 (2013.01); G06T 7/0012 (2013.01); A61B 2576/026 (2013.01); G06T 2207/10092 (2013.01); G06T 2207/30016 (2013.01);
Abstract
Discussed herein is a parametric model for DTI MD histogram fitting, named the Generalized Voss-Dyke function, which is highly successful in segregating NPH cases from potential confounders without reliance on operator dependent region-of-interest analyses or inter-subject registration. The Generalized Voss-Dyke function is useful for managing the imaging of any tissue interfaces.