The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Aug. 11, 2016
Applicants:

Carl Zeiss Meditec, Inc., Dublin, CA (US);

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Alexandre R. Tumlinson, San Leandro, CA (US);

Keith O'Hara, Pleasanton, CA (US);

Angelo Rago, Lafayette, CA (US);

Assignees:

CARL ZEISS MEDITEC, INC., Dublin, CA (US);

CARL ZEISS MEDITECH AG, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/15 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61B 3/102 (2013.01); A61B 3/1025 (2013.01); A61B 3/12 (2013.01); A61B 5/7415 (2013.01);
Abstract

The present application describes the addition of various feedback mechanisms including visual and audio feedback mechanisms to an ophthalmic diagnostic device to assist a subject to self-align to the device. The device may use the visual and non-visual feedback mechanisms independently or in combination with one another. The device may provide a means for a subject to provide feedback to the device to confirm that an alignment condition has been met. Alternatively, the device may have a means for sensing when acceptable alignment has been achieved. The device may capture diagnostic information during the alignment process or may capture after the alignment condition has been met.


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