The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 2020

Filed:

Aug. 25, 2016
Applicant:

Indiana University Research and Technology Corporation, Indianapolis, IN (US);

Inventors:

Larry N. Thibos, Bloomington, IN (US);

Tao Liu, Bloomington, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); G16H 30/40 (2018.01); A61B 3/10 (2006.01); A61B 3/103 (2006.01); A61B 3/107 (2006.01); A61B 3/11 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01); A61F 2/16 (2006.01); A61F 9/008 (2006.01); G02C 7/02 (2006.01); A61B 18/20 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/103 (2013.01); A61B 3/107 (2013.01); A61B 3/1015 (2013.01); A61B 3/112 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01); A61F 2/16 (2013.01); A61F 9/008 (2013.01); G02C 7/028 (2013.01); G16H 30/40 (2018.01); A61B 2018/205547 (2017.05); A61F 2009/0088 (2013.01); A61F 2240/002 (2013.01);
Abstract

Methods are disclosed comprising measuring, with a first scanner, a central part of the visual image, measuring, with a second scanner, a peripheral part of the visual image, calculating, by a processor, a pan-retinal measure of image contrast for an extended area of the retina, and optimizing a pan-retinal visual quality. Methods further comprising optimizing a pan-retinal visual quality are also disclosed. Systems are also disclosed comprising either a scanner or a laser, a non-transitory memory having instructions that, in response to an execution by a processor, the processor receives a first measurement of the central part of the visual image, receives a second measurement of the peripheral part of the visual image, and calculates a pan-retinal measure of image contrast for an extended area of the retina. Methods of manufacturing lenses, including contact lenses are disclosed.


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