The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Jun. 21, 2016
Applicant:
Lg Electronics Inc., Seoul, KR;
Inventors:
Jin Heo, Seoul, KR;
Yongjoon Jeon, Seoul, KR;
Sunmi Yoo, Seoul, KR;
Eunyong Son, Seoul, KR;
Junghak Nam, Seoul, KR;
Assignee:
LG Electronics Inc., Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 19/107 (2014.01); H04N 19/159 (2014.01); H04N 19/176 (2014.01); H04N 19/117 (2014.01); H04N 19/124 (2014.01); H04N 19/59 (2014.01); H04N 19/105 (2014.01); H04N 19/11 (2014.01); H04N 19/172 (2014.01); H04N 19/61 (2014.01); H04N 19/70 (2014.01);
U.S. Cl.
CPC ...
H04N 19/107 (2014.11); H04N 19/105 (2014.11); H04N 19/11 (2014.11); H04N 19/117 (2014.11); H04N 19/124 (2014.11); H04N 19/159 (2014.11); H04N 19/172 (2014.11); H04N 19/176 (2014.11); H04N 19/59 (2014.11); H04N 19/61 (2014.11); H04N 19/70 (2014.11);
Abstract
An intra prediction mode-based image processing method includes: obtaining, on the basis of the intra prediction mode of a current block, a first prediction sample value and a second prediction sample value by using a reference sample neighboring the current block; and generating a prediction sample for the current block by linear interpolation of the first prediction sample value and the second prediction sample value.