The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
May. 29, 2018
Fujitsu Limited, Kawasaki, JP;
Yasuo Noguchi, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An inspection target apparatus includes a generating circuit and a processing unit. The generating circuit generates a value depending on hardware. The processing unit generates, in response to a first request, encoding result data using the generated value and an error-correction encoding method and outputs the encoding result data. The processing unit generates, in response to a second request, decoding result data using designated encoding result data, the generated value, and an error-correction decoding method and outputs the decoding result data. An inspection apparatus includes a storing unit and a processing unit. The storing unit stores encoding result data generated by a different inspection target apparatus and reference data. The processing unit designates encoding result and receives decoding result data from the inspection target apparatus. The processing unit determines whether the decoding result data matches the reference data in comparison with each other.