The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Feb. 12, 2018
Applicant:
Gci Inc., Daejeon, KR;
Inventors:
Assignee:
GCI INC., Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/077 (2013.01); H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/0775 (2013.01); H04B 10/0791 (2013.01);
Abstract
Disclosed is a method of extracting a faulty section of an optical path using a super resolution algorithm. The method includes generating a MUSIC spectrum by applying a MUSIC algorithm or an improved MUSIC algorithm to a received signal. Pieces of data on the received signal are divided into predetermined unit groups, and the MUSIC algorithm or the improved MUSIC algorithm is performed only on a unit group in which a signal corresponding to a reflection event occurs, among the predetermined unit groups.
Quick Actions:
Yu, Bong. (2020). Method for extracting optical line fault section by applying super-resolution algorithm (U.S. Patent No. 10848240). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10848240
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile