The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
May. 25, 2017
Applicant:
SK Hynix Inc., Icheon-si, KR;
Inventor:
Young Bo Shim, Dangjin-si Chungcheongnam-do, KR;
Assignee:
SK hynix Inc., Icheon-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G11C 29/44 (2006.01); G11C 29/36 (2006.01); G06F 11/10 (2006.01); G11C 29/42 (2006.01); G06F 3/06 (2006.01); G06F 11/263 (2006.01); G06F 11/27 (2006.01); G11C 29/10 (2006.01); G11C 29/52 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/36 (2013.01); G11C 29/44 (2013.01); G06F 3/0613 (2013.01); G06F 3/0614 (2013.01); G06F 11/1012 (2013.01); G06F 11/1048 (2013.01); G06F 11/263 (2013.01); G06F 11/27 (2013.01); G11C 29/10 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); G11C 29/56008 (2013.01); G11C 2029/3602 (2013.01);
Abstract
A semiconductor device includes a pattern data generation circuit generating pattern data, a data comparison circuit receiving read data which are outputted from cell arrays included in a core area by a read operation and comparing the read data with the pattern data to generate a fail code, and a fail flag generation circuit comparing the fail code with a set code to generate a fail flag.