The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Sep. 04, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Yoshihiko Iwase, Yokohama, JP;

Hiroki Uchida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); G06T 7/00 (2017.01); G06T 7/55 (2017.01); A61B 3/00 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/1225 (2013.01); G06T 7/0016 (2013.01); G06T 7/33 (2017.01); G06T 7/337 (2017.01); G06T 7/55 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/20201 (2013.01); G06T 2207/30041 (2013.01);
Abstract

An apparatus includes: an acquisition unit configured to acquire pieces of three-dimensional data of a subject eye obtained at different times, the three-dimensional data including pieces of two-dimensional data obtained at different positions; a first planar alignment unit configured to perform first planar alignment including alignment between the pieces of three-dimensional data in a plane orthogonal to a depth direction of the subject eye; a first depth alignment unit configured to perform first depth alignment including alignment between pieces of two-dimensional data in at least one piece of three-dimensional data among the pieces of three-dimensional data and further including alignment between the pieces of three-dimensional data in the depth direction; and a generation unit configured to generate interpolation data of at least one piece of three-dimensional data among the pieces of three-dimensional data by using a result of the first planar alignment and a result of the first depth alignment.


Find Patent Forward Citations

Loading…