The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Nov. 07, 2017
Applicant:
Thermo Electron Scientific Instruments Llc, Madison, WI (US);
Inventors:
Francis J. Deck, Madison, WI (US);
Carla S. Draper, Madison, WI (US);
Alan Ronemus, Oregon, WI (US);
William Robert Keefe, Oconomowoc, WI (US);
Assignee:
Thermo Electron Scientific Instruments LLC, Madison, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); G02B 21/36 (2006.01); G06T 7/20 (2017.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G02B 21/34 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G01J 3/0275 (2013.01); G01J 3/2823 (2013.01); G02B 21/34 (2013.01); G02B 21/365 (2013.01); G06T 7/20 (2013.01); H04N 17/002 (2013.01); G06T 2207/10056 (2013.01);
Abstract
An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattern of features that exhibit contrast when illuminated by a light beam.