The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Oct. 30, 2018
Applicant:

Republic of Korea (National Forensic Service Director Ministry of Public Administration and Security), Seoul, KR;

Inventors:

Nam Kyu Park, Bucheon-si, KR;

Jae Mo Goh, Wonju-si, KR;

Jin Pyo Kim, Yuseong-gu, KR;

Young Il Seo, Wonju-si, KR;

Eun Ah Joo, Yongin-si, KR;

Je Hyun Lee, Wonju-si, KR;

Sang Yoon Lee, Siheung-si, KR;

Dong A Lim, Yuseong-gu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G01B 11/26 (2013.01);
Abstract

According to the present disclosure, a method of calculating an angle of impact of a bloodstain is performed by a device for calculating an angle of impact of a bloodstain and includes obtaining a captured image of an analysis target by using a camera, extracting a spatter stain included in the analysis target, by analyzing the obtained captured image, calculating a major axis length and a minor axis length of the spatter stain, estimating an angle of impact of the spatter stain by using the major axis length and the minor axis length of the spatter stain, and outputting the spatter stain and the angle of impact of the spatter stain.


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