The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Jun. 01, 2020
Applicants:
Yan Wang, San Diego, CA (US);
Cory Mccluskey, San Diego, CA (US);
Inventors:
Yan Wang, San Diego, CA (US);
Cory McCluskey, San Diego, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); C12Q 1/686 (2018.01);
U.S. Cl.
CPC ...
G06T 7/33 (2017.01); C12Q 1/686 (2013.01); G06T 2207/30204 (2013.01);
Abstract
Disclosed is a method for aligning images of high-density signals of a dPCR chip with high precision and accuracy, which assigns each signal spot on an dPCR image to a unified grid. More specifically, the invention provides methods for adjusting the coordinates of signal spots in an image, and aligning the adjusted image to the unified grid by aligning to features of a fiducial marker built in the chip.