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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10846849 B1

PDFFull Text
Date of Patent:
Nov. 24, 2020

Filed:

Jun. 16, 2016

Method for analyzing state of cells in spheroid

Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Naoko Senda, Tokyo, JP;

Toshinari Sakurai, Tokyo, JP;

Assignee:

Hitachi High-Tech Corporation, Tokyo, JP;

Attorney:

Crowell & Moring LLP

Primary Examiner:

Delomia L Gilliard

Int. Cl.
CPC ...
G06T 7/00 (2017.01); C12M 1/34 (2006.01); C12Q 1/02 (2006.01); G01N 21/27 (2006.01); G06K 9/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); C12M 1/34 (2013.01); C12Q 1/02 (2013.01); G01N 21/27 (2013.01); G06K 9/0014 (2013.01); G06K 9/00147 (2013.01); G06T 5/009 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30024 (2013.01);
Abstract

The present invention provides a method and an apparatus for analyzing a cell state, cell death in particular, in an interior of a spheroid non-invasively and quantitatively when the spheroid is cultured. More specifically, the present invention provides a method and an apparatus for analyzing a cell state by implementing optical imaging of a spheroid by using an optical instrument characterized by a high resolution and analyzing the internal structure of the spheroid.

Find Patent Forward Citations

Senda, Naoko. (2020). Method for analyzing state of cells in spheroid (U.S. Patent No. 10846849). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10846849

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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