The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Jun. 16, 2016
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Naoko Senda, Tokyo, JP;
Toshinari Sakurai, Tokyo, JP;
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); C12M 1/34 (2006.01); C12Q 1/02 (2006.01); G01N 21/27 (2006.01); G06K 9/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); C12M 1/34 (2013.01); C12Q 1/02 (2013.01); G01N 21/27 (2013.01); G06K 9/0014 (2013.01); G06K 9/00147 (2013.01); G06T 5/009 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30024 (2013.01);
Abstract
The present invention provides a method and an apparatus for analyzing a cell state, cell death in particular, in an interior of a spheroid non-invasively and quantitatively when the spheroid is cultured. More specifically, the present invention provides a method and an apparatus for analyzing a cell state by implementing optical imaging of a spheroid by using an optical instrument characterized by a high resolution and analyzing the internal structure of the spheroid.