The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Jan. 30, 2018
Applicant:
Ambarella International Lp, Santa Clara, CA (US);
Inventor:
Elliot N. Linzer, Bergenfield, NY (US);
Assignee:
Ambarella International LP, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/13 (2017.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G06T 7/13 (2017.01); G06T 2207/20192 (2013.01);
Abstract
An apparatus includes a first circuit and a second circuit. The first circuit may be configured to (i) generate a sharpened region by sharpening an original region of an image and (ii) generate edge information by detecting an edge in the original region of the image. The second circuit may be configured to (i) evaluate a current sample of the sharpened region proximate to the edge for an artifact based on the edge information and (ii) generate a final sample by adjusting the current sample in the sharpened region where the artifact is detected. The artifact may be an overshoot or an undershoot.