The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Dec. 11, 2017
Applicant:

Ocean Tomo, Llc, Chicago, IL (US);

Inventors:

Matthew Beers, Ashland, OR (US);

Elvir Causevic, San Francisco, CA (US);

Assignee:

Ocean Tomo, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/62 (2006.01); G06N 5/04 (2006.01); G06K 9/00 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06K 9/00442 (2013.01); G06K 9/626 (2013.01); G06K 9/6227 (2013.01); G06K 9/6262 (2013.01); G06K 9/6277 (2013.01); G06N 5/043 (2013.01); G06N 3/0454 (2013.01); G06N 3/086 (2013.01);
Abstract

A machine-learning based artificial intelligence device for finding an estimate of patent quality, such as patent lifetime or term is disclosed. Such a device may receive a first set of patent data and generate a list of binary classifiers. A candidate set of binary classifiers may be selected and using a heuristic search, for example an artificial neural network (ANN), a genetic algorithm, a final set of binary classifiers is found by maximizing iteratively a yield according to a cost function, such an area under a curve (AUC) of a receiver operating characteristic (ROC). The device may then receive patent information for a target patent and report an estimate of patent quality according to the final set of binary classifiers.


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