The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Oct. 08, 2016
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventor:

Meng Wang, Nanjing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6252 (2013.01); G06K 9/00711 (2013.01); G06K 9/6215 (2013.01); G06K 9/6242 (2013.01); G06K 9/6267 (2013.01); G01N 2015/1477 (2013.01);
Abstract

Apparatus, method, computer program product and computer readable medium are disclosed for distance estimation between samples. The method includes: modeling the distribution of each of two feature vector sets by a non-parametric model; and calculating the distance of the two distributions, wherein a kernel function is used in the non-parametric model, the kernel function is optimized based on labeled training data, the first feature vector set includes a plurality of feature vectors extracted from a sample, and the second feature vector set includes a plurality of feature vectors extracted from another sample.


Find Patent Forward Citations

Wang, Meng. (2020). Apparatus, method and computer program product for distance estimation between samples (U.S. Patent No. 10846565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10846565

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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