The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Sep. 12, 2018
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

Zihan Hans Liu, Cambridge, MA (US);

Nathaniel Bogan, Natick, MA (US);

Andrew Hoelscher, Somerville, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/73 (2017.01); G06F 17/16 (2006.01); G06T 1/00 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6214 (2013.01); G06F 17/16 (2013.01); G06K 9/00201 (2013.01); G06T 1/0014 (2013.01); G06T 7/73 (2017.01);
Abstract

The techniques described herein relate to methods, apparatus, and computer readable media configured to test a pose of a model in three-dimensional data. Three-dimensional data of an object is received, the three-dimensional data comprising a set of data entries. The three-dimensional data is converted to a field comprising a set of cells that each have an associated value, comprising determining, for each cell value, representative data based on one or more data entries from the set of data entries of the three-dimensional data. A pose of the model is tested with the field to determine a score for the pose.


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