The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Jan. 04, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Masato Hirade, Kyoto, JP;

Kenji Yamasaki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/03 (2006.01); G06K 9/46 (2006.01); G06K 9/20 (2006.01); G06T 5/50 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06K 9/03 (2013.01); G06K 9/2054 (2013.01); G06K 9/4604 (2013.01); G06T 5/50 (2013.01); G06T 7/11 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20224 (2013.01);
Abstract

A data correction method for allowing any observer to satisfactorily perform height correction on an image is provided. Specifically, a data correction method for correcting height of a plurality of pieces of measurement data by using image data acquired by a scanning probe microscope is disclosed. In this data correction method, a computer extracts a reference plane region from the image data, selects three pieces of measurement data, from the pieces of measurement data, at three points in the extracted reference plane region as first to third reference point data, and performs height correction on the other pieces of measurement data on the assumption that the first to third reference point data have the same height.


Find Patent Forward Citations

Loading…