The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Jan. 15, 2019
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Warren Mark Fernandes, Mumbai, IN;

Anal Jyoti Goswami, Assam, IN;

Senthilnathan K, Cuddalore, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 16/955 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01); G06F 16/955 (2019.01);
Abstract

Systems and methods are provided for determining a first test automate is associated with the same application as a second test automate, and for each action in the first test automate, determining a common action in the second test automate, determining that an element identifier in the first test automate for the common action has changed in the second test automate, and recording the changed element identifier in a data store, the data store comprising a list of changed element identifiers for each of a plurality of applications. The data store is provided so that element identifiers in at least one custom test automate corresponding to the changed element identifiers for at least one application are automatically determined based on the list of changed element identifiers for each of the plurality of applications.


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