The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Nov. 30, 2018
Applicant:

Institute for Information Industry, Taipei, TW;

Inventors:

Chia-Wei Tien, Taipei, TW;

Pei-Yi Lin, Taipei, TW;

Chin-Wei Tien, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06N 20/00 (2019.01);
Abstract

A device for producing test data stores a plurality of simulated test data each of which substantially conforms to the data format accepted by a device under test (DUT). The data format includes different data blocks. The device for producing test data also mutates each of the simulated test data in one of a plurality of mutation forms to generate a plurality of first test data for testing the DUT. Each of the mutation forms refers to mutating one of the data blocks in one of a plurality of mutation ways.


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