The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Feb. 28, 2018
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;

Inventors:

Toshio Hirano, Yokohama Kanagawa, JP;

Yoshihiro Taniyama, Shinagawa Tokyo, JP;

Masayuki Ichimonji, Kita Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G01M 99/00 (2011.01); G05B 17/00 (2006.01); G05B 17/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0243 (2013.01); G01M 99/005 (2013.01); G05B 17/00 (2013.01); G05B 17/02 (2013.01); G05B 23/0254 (2013.01); G05B 23/0281 (2013.01);
Abstract

In one embodiment, a failure diagnosis apparatus includes a simulation module configured to simulate a target device to output virtual measured data obtained when the target device is in at least any one of one or more failure modes. The apparatus further includes a measured data obtaining module configured to obtain measured data that is measured from the target device. The apparatus further includes a failure mode identifying module configured to identify a failure mode of the target device based on the virtual measured data and the measured data.


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