The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Mar. 19, 2019
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Do Yeong Park, Hwaseong-si, KR;

Ki Won Park, Asan-si, KR;

Kyung Ho Kim, Seongnam-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01); G02F 1/1362 (2006.01); G02F 1/1345 (2006.01); H01L 27/12 (2006.01); H01L 25/18 (2006.01); H01L 27/32 (2006.01); G01R 31/28 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136286 (2013.01); G01R 31/2825 (2013.01); G02F 1/13452 (2013.01); G03F 7/2022 (2013.01); H01L 25/18 (2013.01); H01L 27/124 (2013.01); H01L 27/1288 (2013.01); H01L 27/3223 (2013.01); H01L 27/3276 (2013.01); G02F 2001/136254 (2013.01); G02F 2001/136295 (2013.01); H01L 2227/323 (2013.01);
Abstract

A display panel including: a display portion including a plurality of signal lines and a plurality of pixels connected to the signal lines; a peripheral portion provided around the display portion; an integrated circuit (IC) mounting unit provided on the peripheral portion, and including a plurality of driver ICs connected to a data driver; and a test pad portion provided on the peripheral portion and testing the signal lines. The test pad portion includes a gate driver test pad portion including a gate driver test pad unit and a data line test pad unit including a data line test pad unit, the data line test pad unit includes an outermost data line test pad unit provided on respective sides of the data line test pad portion and a plurality of intermediate data line test pad units provided between the outermost data line test pad units.


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