The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Nov. 20, 2018
Bruker Optik Gmbh, Ettlingen, DE;
Niels Kroeger-Lui, Kaiserslautern, DE;
Bruker Optik GmbH, Ettlingen, DE;
Abstract
An infrared microscope includes a radiation source, a sample plane, an objective lens, a path length modulator and a detector. The radiation source emits temporally coherent infrared radiation that propagates along an optical path of the microscope during operation. A sample is disposed in the sample plane. The detector detects the infrared radiation after the radiation interacts with the sample. The objective lens forms an image of the sample plane on the detector. The path length modulator continuously varies the optical path length of the optical path between the sample plane and the detector. The path length modulator can be a wedge or a diffusing screen that rotates during operation, a phase modulator that rotates during operation and that has regions with different indices of refraction, a tilting element that tilts about an axis during operation, or a diffuser mirror that reflects the infrared radiation and that rotates during operation.