The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Jun. 22, 2017
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventor:

Mineo Tsushima, Kyoto-fu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/00 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01); G10K 11/34 (2006.01); A61B 8/14 (2006.01); A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
G01S 7/52087 (2013.01); A61B 8/14 (2013.01); A61B 8/4477 (2013.01); A61B 8/5207 (2013.01); G01S 7/52026 (2013.01); G01S 15/8915 (2013.01); G01S 15/8997 (2013.01); G10K 11/346 (2013.01);
Abstract

Ultrasound signal processing device including: transmitter performing transmission events while varying a focal point; receiver generating, for each transmission event, receive signal sequences for transducer elements; delay-and-sum calculator generating, for each transmission event, a sub-frame acoustic line signal including an acoustic line signal for each measurement point located on target lines passing through the focal point and composing a target line group; and synthesizer combining sub-frame acoustic line signals to generate a frame acoustic line signal. The target lines are straight lines, and any measurement point, on any target line, that is spaced away from the focal point by a predetermined distance or more satisfies a condition that distance between the measurement point and a most nearby measurement point on the same target line is smaller than distance between the measurement point and a most nearby one among measurement points on an adjacent target line.


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