The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Jun. 30, 2017
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
Michael Sorensen, Woburn, MA (US);
Philip Babcock, Westford, MA (US);
Cort Johnson, Arlington, MA (US);
Neil Sunil Patel, Cambridge, MA (US);
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
Abstract
A system and method for calibrating rigid and non-rigid arrays of 3-axis magnetometers. Such arrays might be used to analyze structures containing ferromagnetic material. The calibration determines scale factor and bias parameters of each magnetometer in the array, and the relative orientation and position of each magnetometer in the array. Once the parameters are determined, the actual magnetic field value at the magnetometer location can be simply related to magnetometer measurements. The method and system can be used to calibrate an array of 3-axis magnetometers in aggregate as opposed to individual magnetometers. This is critical in large arrays to increasing reproducibility of the calibration procedure and decreasing time required to complete calibration procedure.