Semiconductor product quality management server, semiconductor device, and semiconductor product quality management system

Abstract

An additional test pattern acquiring unit acquires a test pattern, which is not yet executed to the semiconductor device serving as a target of executing an additional test among test patterns stored in a test pattern information DB, as an additional test pattern with reference to a semiconductor manufacturing history information DB. Also, an additional test transmitting unit transmits the additional test pattern acquired by the additional test pattern acquiring unit to the semiconductor device serving as the target of the additional test through a network. An additional test result acquiring unit acquires a test execution result together with an ID of the semiconductor device, and a registration unit registers identification information of the executed test pattern, an execution result of the test pattern, and an execution timing of the test in a semiconductor product history information DB so as to be associated with the acquired ID of the semiconductor device.