The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Jul. 20, 2018
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Markus Freidhof, Kirchseeon, DE;

Andreas Maier, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/167 (2006.01); G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 23/167 (2013.01); G01R 13/02 (2013.01);
Abstract

The present invention relates to a processing of digitally measured signals. When sampling a measurement signal with a predetermined sampling rate, aliasing effects may occur, if a Nyquist condition is violated. For this purpose, the present invention suggests to analyze a frequency spectrum of a signal and to compare the frequency components of the spectrum with the setting of a measurement apparatus, in particular a sampling rate of the measurement apparatus. If a measurement signal comprises frequency components which may violate the Nyquist condition, an alert may be generated to adapt the set of the measurement arrangement.


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