The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Oct. 31, 2019
Applicant:
Quidel Corporation, San Diego, CA (US);
Inventors:
David Dickson Booker, Albuquerque, NM (US);
Jhobe Steadman, Poway, CA (US);
Assignee:
Quidel Corporation, San Diego, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/278 (2013.01); G01N 21/645 (2013.01); G01N 2201/068 (2013.01); G01N 2201/10 (2013.01); G01N 2201/12746 (2013.01); G01N 2201/12753 (2013.01); G01N 2201/12761 (2013.01);
Abstract
Disclosed herein is a method for improving the precision of a test result from an instrument with an optical system that detects a signal. The method comprises including in the instrument a normalization target disposed directly or indirectly in the optical path of the optical system. Also disclosed are instruments comprising a normalization target, and systems comprising such an instrument and a test device that receives a sample suspected of containing an analyte.