The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Sep. 23, 2016
Applicant:
Touchcode Holdings, Llc, New York, NY (US);
Inventors:
Steven Martin Cohen, New York, NY (US);
Wayne L. Nemeth, Rye, NY (US);
Michael A. Brody, Philadelphia, PA (US);
Lev M. Barsky, New York, NY (US);
Assignee:
Touchcode Holdings, LLC, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/20 (2006.01); G06F 3/045 (2006.01); G01L 27/00 (2006.01); G06F 3/041 (2006.01); G01L 25/00 (2006.01); G01L 1/22 (2006.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G01L 1/205 (2013.01); G01L 25/00 (2013.01); G01L 27/005 (2013.01); G06F 3/045 (2013.01); G06F 3/0414 (2013.01); G01L 1/2206 (2013.01); G06Q 10/087 (2013.01);
Abstract
A method of reading and quantifying pressure points or bumps or a product outline to extract a pattern that, when decoded, uniquely defines a product or class of products by defining the theoretical centers of applied pressure, determining the spatial relationship between more than one center or a product outline to define which pattern belongs to which product, and correlating each pattern with templates of stored patterns to determine what product is represented by each respective pattern.