The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2020

Filed:

Jan. 11, 2018
Applicant:

Facebook Technologies, Llc, Menlo Park, CA (US);

Inventors:

Serol Turkyilmaz, Redmond, WA (US);

Sean Jason Keller, Kirkland, WA (US);

Tristan Thomas Trutna, Seattle, WA (US);

Assignee:

Facebook Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/16 (2006.01); G06F 3/01 (2006.01); G01B 7/16 (2006.01);
U.S. Cl.
CPC ...
G01D 5/16 (2013.01); G01B 7/18 (2013.01); G06F 3/014 (2013.01);
Abstract

A strain gauge system includes a layered structure and a resistance sensor. The layered structure has an unstretched position and a range of stretched positions. The layered structure includes a multilayer thin film having alternating layers of ferromagnetic and non-ferromagnetic materials. The layered structure also includes a flexible magnet that produces a magnetic field. The resistance sensor measures a resistance of the multilayer thin film. The resistance of the multilayer thin film is lower when the layered structure is in the unstretched position than when it is in a stretched position in the range of stretched positions.


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