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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10844452 B1

PDFFull Text
Date of Patent:
Nov. 24, 2020

Filed:

Jun. 09, 2016

Grain-oriented electrical steel sheet and method for manufacturing the same

Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Yukihiro Shingaki, Tokyo, JP;

Yasuyuki Hayakawa, Tokyo, JP;

Masanori Takenaka, Tokyo, JP;

Assignee:

JFE STEEL CORPORATION, Tokyo, JP;

Attorney:

Kenja IP Law PC

Primary Examiner:

Colleen P Dunn

Assistant Examiner:

Michael J Kachmarik

Int. Cl.
CPC ...
C21D 8/12 (2006.01); C21D 9/46 (2006.01); C22C 38/60 (2006.01); C22C 38/00 (2006.01); H01F 1/16 (2006.01); C22C 38/28 (2006.01); C22C 38/40 (2006.01); C21D 6/00 (2006.01); C22C 38/02 (2006.01); C22C 38/16 (2006.01); C22C 38/12 (2006.01); C22C 38/08 (2006.01); C22C 38/14 (2006.01); C22C 38/20 (2006.01); C22C 38/18 (2006.01); C22C 38/04 (2006.01); C22C 38/06 (2006.01); C22C 38/22 (2006.01); C22C 38/32 (2006.01); C22C 38/34 (2006.01); H01F 1/147 (2006.01);
U.S. Cl.
CPC ...
C21D 8/1255 (2013.01); C21D 6/008 (2013.01); C21D 8/12 (2013.01); C21D 8/1272 (2013.01); C21D 8/1283 (2013.01); C21D 9/46 (2013.01); C22C 38/00 (2013.01); C22C 38/001 (2013.01); C22C 38/002 (2013.01); C22C 38/004 (2013.01); C22C 38/008 (2013.01); C22C 38/02 (2013.01); C22C 38/04 (2013.01); C22C 38/06 (2013.01); C22C 38/08 (2013.01); C22C 38/12 (2013.01); C22C 38/14 (2013.01); C22C 38/16 (2013.01); C22C 38/18 (2013.01); C22C 38/20 (2013.01); C22C 38/22 (2013.01); C22C 38/28 (2013.01); C22C 38/32 (2013.01); C22C 38/34 (2013.01); C22C 38/40 (2013.01); C22C 38/60 (2013.01); H01F 1/14775 (2013.01); H01F 1/16 (2013.01);
Abstract

The disclosure contains, in mass % or mass ppm: C: 0.005% or less, Si: 2.0% to 5.0%, Mn: 0.01% to 0.5%, sol.Al: 10 ppm or less, N: 15 ppm or less, S and Se: each 10 ppm or less, and three or more selected from Sn, Sb, Cr, P, Mo and B whose contents satisfy a relational expression of 0.16≤[% Sn]+[% Sb]+[% Cr]+2×[% P]+[% Mo]+[% B]≤0.50, the balance being Fe and inevitable impurities, where a number of times of repeated bending in a bend test is 10 or more.

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