The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2020
Filed:
Nov. 01, 2017
Carl Zeiss Meditec Ag, Jena, DE;
CARL ZEISS MEDITEC AG, Jena, DE;
Abstract
An operating microscope () for observing an eye () is provided. The operating microscope () comprises a main objective () and a fundus imaging system () that is positionable in the beam path () between the eye () and the main objective (), said fundus imaging system having an ophthalmoscopy magnifier (). The main objective () of the operating microscope () has a focal length in the range between 90 mm and 160 mm. The fundus imaging system () also can comprise an optics group (), the dispersion properties of which are matched to the dispersion properties of the ophthalmoscopy magnifier () in such a way that the optics group () compensates a chromatic aberration of the ophthalmoscopy magnifier ().