The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Jan. 30, 2018
Applicant:

Oakland University, Rochester, MI (US);

Inventors:

Lianxiang Yang, Rochester Hills, MI (US);

Junrui Li, Auburn Hills, MI (US);

Guobiao Yang, Rochester Hills, MI (US);

Wan Xu, Auburn Hills, MI (US);

Boyang Zhang, Auburn Hills, MI (US);

Assignee:

Oakland University, Rochester, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/218 (2018.01); H04N 13/257 (2018.01); H04N 13/254 (2018.01); G01B 11/16 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
H04N 13/218 (2018.05); G01B 11/16 (2013.01); G01B 11/24 (2013.01); H04N 13/254 (2018.05); H04N 13/257 (2018.05);
Abstract

An imaging system includes a first light source configured to provide a first light to an object, a second light source configured to provide a second light to said object, a color camera configured to capture an image of the object, a first mirror disposed between the first light source and said object, a second mirror disposed between the second light source and said object, a beam splitter disposed between the color camera and said object, a first filter for the first light source, a second filter for the second light source, and a processor configured to determine at least one of a shape, a deformation, and a strain measurement of said object from the image.


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