The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Dec. 14, 2017
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventors:

Yasuaki Hisamatsu, Kanagawa, JP;

Kazutaka Takaki, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01); H03M 7/16 (2006.01); H03C 3/09 (2006.01); H03M 1/08 (2006.01); H03M 1/28 (2006.01); H03M 1/56 (2006.01); H03M 1/68 (2006.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01); H03C 3/0966 (2013.01); H03M 1/0872 (2013.01); H03M 1/285 (2013.01); H03M 1/56 (2013.01); H03M 1/687 (2013.01); H03M 7/16 (2013.01);
Abstract

The present disclosure relates to an imaging element and a method for controlling an imaging element, an imaging apparatus, and an electronic apparatus that can reduce the size of the imaging element and can reduce power consumption. First, a gray code corresponding to a P-phase pixel signal of each pixel is converted into a binary code. Then, a difference between a binary code corresponding to the converted same bit and a binary code of the pixel signal in which all bits are 0 and which is latched in a temporary latch is continuously calculated and is latched as the binary code of the P-phase pixel signal in the temporary latch. Then, a gray code corresponding to a D-phase pixel signal of each pixel is converted into a binary code. Then, a difference between a binary code corresponding to the converted same bit and the binary code of P-phase the pixel signal which is latched in the temporary latch is continuously calculated. The present disclosure can be applied to an imaging apparatus.


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