The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Aug. 30, 2018
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventor:

David Hammond, Morrisville, NC (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/06 (2009.01); H04B 17/391 (2015.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04B 17/3912 (2015.01); H04W 24/08 (2013.01);
Abstract

Methods, systems, and computer readable media for testing a central unit using a distributed unit emulation are disclosed. One exemplary method includes receiving, by a distributed unit emulation component of a mobile network device, an ingress signal from a central unit device over an evolved common public radio interface (eCPRI) link and communicating, by the distributed unit emulation component, a time domain based ingress signal containing data originally included in the received ingress signal to a plurality of user equipment (UE) emulations. The method also includes utilizing, by at least one of the plurality of UE emulations, the time domain based ingress signal to generate test traffic data for stress testing the central unit device. The method further includes communicating a time domain based egress signal including the test traffic data to the central unit device via the distributed unit emulation component.


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