The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Feb. 18, 2020
Applicant:
Ets-lindgren Inc., Cedar Park, TX (US);
Inventor:
Michael David Foegelle, Cedar Park, TX (US);
Assignee:
ETS-Lindgren, Inc., Cedar Park, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/364 (2015.01); H04W 24/06 (2009.01); H04W 72/04 (2009.01); H04B 1/04 (2006.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/0087 (2013.01); H04B 17/0085 (2013.01); H04B 17/364 (2015.01); H04W 24/06 (2013.01); H04W 72/042 (2013.01); H04B 17/29 (2015.01); H04B 2001/0408 (2013.01);
Abstract
A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.