The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Aug. 13, 2019
Applicant:

Mediatek Inc., Hsinchu, TW;

Inventors:

Ying-Zu Lin, Hsinchu, TW;

Chin-Yu Lin, Hsinchu, TW;

Chih-Hou Tsai, Hsinchu, TW;

Shan-Chih Tsou, Hsinchu, TW;

Chao-Hsin Lu, Hsinchu, TW;

Assignee:

MEDIATEK INC., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/08 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0854 (2013.01);
Abstract

A noise-shaping successive approximation analog-to-digital converter (NS-SAR ADC) using a passive noise-shaping technique with 1-input-pair SAR comparator is introduced. A residue sampling and integration circuit is coupled between a DAC and the comparator, for sampling a residue voltage generated by the DAC and charge-sharing of the sampled residue voltage. A first integral capacitor is coupled between a first input terminal of a comparator and a first output terminal of a DAC. After a first residue capacitor samples a residue generated by the DAC, the first residue capacitor is coupled to the first integral capacitor for charge-sharing of the residue voltage.


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