The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Oct. 10, 2018
Applicant:

AU Optronics (Kunshan) Co., Ltd., Kunshan, CN;

Inventor:

Meng Hsiu Ho, Kunshan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G09G 3/00 (2006.01); H01L 21/768 (2006.01); H01L 27/12 (2006.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); G09G 3/006 (2013.01); H01L 21/76894 (2013.01); H01L 22/14 (2013.01); H01L 22/22 (2013.01); H01L 27/124 (2013.01); G09G 2330/12 (2013.01);
Abstract

Disclosed are a display device and a method for repairing and detecting a thin film transistor of the display device. The display device includes a plurality of thin film transistors, a gate line, a data line, and a testing circuit. The testing circuit includes a first detection pad, a second detection pad, a third detection pad, a first detection metal wire, and a second detection metal wire. The first detection metal wire is connected to the second detection pad. The second detection metal wire has a first branch, a detection metal pad, and a second branch. The first branch connects the first detection pad and the detection metal pad. The second branch connects the third detection pad and the detection metal pad. The detection metal pad overlaps with the first detection metal wire in a vertical direction. The first detection metal wire has a width same as that of the gate line, and the detection metal pad has a width same as that of the data line.


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