The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Dec. 20, 2019
Applicant:
Silicon Works Co., Ltd., Daejeon, KR;
Inventors:
Ki Taek Kim, Daejeon, KR;
Jun Young Park, Daejeon, KR;
Doo Hwa Jang, Daejeon, KR;
Seung Wan Yu, Daejeon, KR;
Do Yeon Kim, Daejeon, KR;
Assignee:
Silicon Works Co., Ltd., Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 5/10 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 5/10 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0285 (2013.01); G09G 2320/0693 (2013.01); G09G 2360/141 (2013.01); G09G 2360/147 (2013.01);
Abstract
A Mura correction system which performs correction of a Mura pixel in a detection image obtained by photographing a display panel. The Mura correction system may detect an individual Mura pixel and realize correction on the detected one Mura pixel, and may realize block-based correction on Mura pixels of some region of a Mura block.
Kim, Ki. (2020). Mura correction system (U.S. Patent No. 10839731). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10839731
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