The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

May. 30, 2017
Applicant:

Yandex Europe Ag, Lucerne, CH;

Inventors:
Assignee:

YANDEX EUROPE AG, Lucerne, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/93 (2019.01); G06F 16/33 (2019.01); G06F 16/2457 (2019.01); G06F 16/903 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/93 (2019.01); G06F 16/24578 (2019.01); G06F 16/334 (2019.01); G06F 16/90335 (2019.01);
Abstract

Methods and systems for selecting a selected-sub-set of features from a plurality of features for training a machine learning module, the training of the machine learning module to enable classification of an electronic document to a target label, the plurality of features associated with the electronic document. In one embodiment, the method comprises analyzing a given training document to extract the plurality of features, and for a given not-yet-selected feature of the plurality of features: generating a set of relevance parameters iteratively, generating a set of redundancy parameters iteratively and determining a feature significance score based on the set of relevance parameters and the set of redundancy parameters. The method further comprises selecting a feature associated with a highest value of the feature significance score and adding the selected feature to the selected-sub-set of features.


Find Patent Forward Citations

Bezzubtseva, Anastasiya. (2020). Method and system of selecting training features for a machine learning algorithm (U.S. Patent No. 10839315). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10839315

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