The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Jun. 21, 2018
Applicant:

Arm Limited, Cambridge, GB;

Inventors:
Assignee:

Arm Limited, Cambridge, GB;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/00 (2020.01); G06F 30/367 (2020.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 2111/10 (2020.01);
Abstract

Various implementations described herein are directed to a system and methods for validating data points associated with an integrated circuit. In one implementation, the method may include retrieving data table associated with an integrated circuit, wherein the data table includes characterized electrical data associated with one or more cells of the integrated circuit. Further, the method may include converting the data table to one or more relative matrices. The one or more relative matrices are analyzed to determine a trend formed by entries of the one or more relative matrices. Further, the method may include determining whether one or more entries of the one or more relative matrices deviate from the trend. In response to the determination, the data table is flagged.


Find Patent Forward Citations

Balasubramanian, Satheesh. (2020). Error detection technique based on identifying data trend issues (U.S. Patent No. 10839128). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10839128

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…