The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

May. 31, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Stephen Thomas Quay, Vancouver, CA;

Yaoguang Wei, Austin, TX (US);

Bijian Chen, Austin, TX (US);

Ying Zhou, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/327 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/327 (2020.01); G06F 2119/12 (2020.01);
Abstract

A method a system include obtaining a master list of layer traits including wire codes, each of the wire codes indicating a width of a corresponding wire, and including a maximum reach length of the corresponding wire and a time of flight (TOF) through the corresponding wire. The method also includes processing the master list of the layer traits to obtain a final list of the layer traits, the final list of the layer traits having fewer entries than the master list of the layer traits and being in a ranked order. A metric is calculated for each adjacent pair of the layer traits in the final list of layer traits. The final list of the layer traits and the corresponding metric is used to assign the corresponding wires to different interconnects among components of an integrated circuit.


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