The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2020

Filed:

Nov. 26, 2018
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Nicholas Akiona, San Jose, CA (US);

Teresa Sheausan Tung, San Jose, CA (US);

Carl Matthew Dukatz, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G05B 23/02 (2006.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01); G06Q 10/06 (2012.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G05B 23/0281 (2013.01); G06F 11/3684 (2013.01); G06F 30/20 (2020.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06Q 10/06 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for generating multiple distinct test plans using a computing system. The system merges the each of the test plans to produce a first test plan and obtains performance data about automated execution of the first test plan by a robotics system. The system generates learned inferences for determining predictions about execution of the first test plan based on analysis of the performance data and adjusts the first test plan based on the learned inferences. The system generates a second test plan for execution by the computing system based on adjustments to the first test plan and performs the second test plan to test multiple devices using the robotics system.


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