The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Mar. 01, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3093 (2013.01); G06F 11/00 (2013.01);
Abstract
Adaptive monitoring dynamically optimizes the monitoring frequency of metrics with respect to system constraints. One or more metrics are monitored. The monitoring includes receiving a value for the metric and evaluating the received metric value. If the evaluation is determined to affect one or monitoring parameters, or if an environment-based event occurs the metrics are adapted. Adapting metrics includes removing or adding a metric based on each metric's correlation to the affected monitoring parameter or environment based trigger. The frequencies of the metrics are optimized based on the available resources.