The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Jan. 17, 2018
Applicant:
Hrl Laboratories, Llc, Malibu, CA (US);
Inventors:
Daniel K. Xie, Sugar Land, TX (US);
Jiejun Xu, Chino, CA (US);
Tsai-Ching Lu, Thousand Oaks, CA (US);
Assignee:
HRL Laboratories, LLC, Malibu, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
G05B 13/042 (2013.01);
Abstract
Described is a system for estimating long-term causal effects of interventions on various entities. A synthetic control is generated from selected donor series such that parameters involved in the generation of the synthetic control can be tuned automatically, or manually by a user. Post-intervention synthetic control values are generated from the synthetic control, and estimates of long-term causal effects of an intervention onto aggregate units similar to the donor series are determined. A device is controlled based on the determined estimates.