The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2020
Filed:
Aug. 10, 2018
Applicant:
Gammex, Inc., Middleton, WI (US);
Inventor:
Jason Holzmann, Waunakee, WI (US);
Assignee:
Gammex, Inc., Middleton, WI (US);
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 15/08 (2011.01); G06T 11/00 (2006.01); G01T 7/00 (2006.01); B33Y 10/00 (2015.01); B33Y 70/00 (2020.01); B33Y 80/00 (2015.01); A61B 6/00 (2006.01); B29C 64/118 (2017.01); B29L 31/00 (2006.01); B29K 55/02 (2006.01); B29K 509/02 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); A61B 6/583 (2013.01); B29C 64/118 (2017.08); B33Y 10/00 (2014.12); B33Y 70/00 (2014.12); B33Y 80/00 (2014.12); B29K 2055/02 (2013.01); B29K 2509/02 (2013.01); B29L 2031/753 (2013.01);
Abstract
A radiological evaluation device and a method of constructing a radiological evaluation device include a first high-Z material. A first test pattern is constructed by extruding a first high-Z material according to a first test pattern design file. The first high-Z material is combined with a second material to construct the first test pattern. The first high-Z material is radiologically distinct from the second material. A phantom body is constructed. The first test pattern is secured to the phantom body.